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Article Details
- Journal Title
- Active and Passive Electronic Components
- Volume
- 2017
- Article Title
- Total Ionizing Dose Effects of Si Vertical Diffused MOSFET with SiO2 and Si3N4/SiO2 Gate Dielectrics
- List of Authors
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- Jiongjiong Mo(ORCID ID: http://orcid.org/0000-0002-5613-7706)
- Xuran Zhao(ORCID ID: http://orcid.org/0000-0002-6830-7266)
- Article ID
- 9685685
- Article Type
- Research Article
- No. of Pages
- 7 Pages
- Additional Authors
Invoice Details
- Invoice Issue Date
- 25 April 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $