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Article Details
- Journal Title
- Active and Passive Electronic Components
- Volume
- 26
- Article Title
- On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs
- List of Authors
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- W. C. Chien
- C. S. Wang
- Article ID
- 951317
- Article Type
- No. of Pages
- 13 Pages
- Corresponding Author
- K. F. Yarn
- Additional Authors
Invoice Details
- Invoice Issue Date
- 1 May 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $