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Article Details
- Journal Title
- Active and Passive Electronic Components
- Volume
- 2012
- Article Title
- The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions
- List of Authors
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- Wenqi Zhang
- Chi-Yun Cheng
- Wen-kuan Yeh
- Article ID
- 872494
- Article Type
- Research Article
- No. of Pages
- 4 Pages
- Corresponding Author
- Yi-Lin Yang
- Additional Authors
Invoice Details
- Invoice Issue Date
- 8 May 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $