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Article Details
- Journal Title
- Journal of Nanomaterials
- Volume
- 2014
- Article Title
- Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
- List of Authors
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- Shih-Chang Tsai
- San-Lein Wu
- Jone-Fang Chen
- Bo-Chin Wang
- Kai-Shiang Tsai
- Tsung-Hsien Kao
- Chih-Wei Yang
- Cheng-Guo Chen
- Kun-Yuan Lo
- Osbert Cheng
- Yean-Kuen Fang
- Article ID
- 787132
- Article Type
- Research Article
- No. of Pages
- 6 Pages
- Corresponding Author
- Po Chin Huang
- Additional Authors
Invoice Details
- Invoice Issue Date
- 19 April 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $