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Article Details

Journal Title
Journal of Nanomaterials
Volume
2014
Article Title
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
List of Authors
  • Shih-Chang Tsai
  • San-Lein Wu
  • Jone-Fang Chen
  • Bo-Chin Wang
  • Kai-Shiang Tsai
  • Tsung-Hsien Kao
  • Chih-Wei Yang
  • Cheng-Guo Chen
  • Kun-Yuan Lo
  • Osbert Cheng
  • Yean-Kuen Fang
Article ID
787132
Article Type
Research Article
No. of Pages
6 Pages
Corresponding Author
Po Chin Huang
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Invoice Details

Invoice Issue Date
17 August 2022
Type of Reprints
Colored, Covered
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