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Article Details

Journal Title
Advances in Materials Science and Engineering
Volume
2017
Article Title
Erratum to “Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors”
List of Authors
  • S. Ahmed
  • M. Ali
Article ID
6050541
Article Type
Erratum
No. of Pages
1 Page
Corresponding Author
Z. N. Khan
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Invoice Issue Date
25 April 2024
Type of Reprints
Colored, Covered
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