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Article Details
- Journal Title
- VLSI Design
- Volume
- 2008
- Article Title
- Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test
- List of Authors
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- Vincent Beroulle
- Chantal Robach
- Smail Tedjini
- Jean-Louis Carbonero
- Article ID
- 596146
- Article Type
- Research Article
- No. of Pages
- 9 Pages
- Corresponding Author
- Yves Joannon
- Additional Authors
Invoice Details
- Invoice Issue Date
- 25 April 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $