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Article Details
- Journal Title
- Advances in Materials Science and Engineering
- Volume
- 2014
- Article Title
- Room-Temperature Voltage Stressing Effects on Resistive Switching of Conductive-Bridging RAM Cells with Cu-Doped SiO2 Films
- List of Authors
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- Bing-Xun Wang
- Article ID
- 594516
- Article Type
- Research Article
- No. of Pages
- 6 Pages
- Corresponding Author
- Jian-Yang Lin
- Additional Authors
Invoice Details
- Invoice Issue Date
- 1 May 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $