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Article Details
- Journal Title
- Advances in Condensed Matter Physics
- Volume
- 2018
- Article Title
- The TDDB Characteristics of Ultra-Thin Gate Oxide MOS Capacitors under Constant Voltage Stress and Substrate Hot-Carrier Injection
- List of Authors
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- Jingyu Shen(ORCID ID: http://orcid.org/0000-0002-4472-5105)
- Can Tan
- Rui Jiang
- Wei Li
- Jianjun Li
- Jingping Wu
- Article ID
- 5483756
- Article Type
- Research Article
- No. of Pages
- 6 Pages
- Additional Authors
Invoice Details
- Invoice Issue Date
- 4 May 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $