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Article Details
- Journal Title
- Advances in Materials Science and Engineering
- Volume
- 2014
- Article Title
- Study of Interface Charge Densities for ZrO2 and HfO2 Based Metal-Oxide-Semiconductor Devices
- List of Authors
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- Reshmi Maity(ORCID ID: http://orcid.org/0000-0002-1254-3075)
- R. K. Thapa
- S. Baishya(ORCID ID: http://orcid.org/0000-0003-4187-7039)
- Article ID
- 497274
- Article Type
- Research Article
- No. of Pages
- 6 Pages
- Additional Authors
Invoice Details
- Invoice Issue Date
- 23 April 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $