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Order Details
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Confirm
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Article Details
- Journal Title
- Science and Technology of Nuclear Installations
- Volume
- 2024
- Article Title
- Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices
- List of Authors
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- Yanru Ren(ORCID ID: https://orcid.org/0009-0002-5600-8485)
- Min Zhu(ORCID ID: https://orcid.org/0000-0002-7207-192X)
- Minghui Liu
- Xuehui Dai(ORCID ID: https://orcid.org/0009-0004-8483-7541)
- Shengao Wang(ORCID ID: https://orcid.org/0000-0001-7262-9228)
- Longxian Li(ORCID ID: https://orcid.org/0000-0002-2694-171X)
- Article ID
- 3616902
- Article Type
- Review Article
- No. of Pages
- 17 Pages
- Additional Authors
Invoice Details
- Invoice Issue Date
- 21 May 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $