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Article Details
- Journal Title
- Active and Passive Electronic Components
- Volume
- 2012
- Article Title
- Comparative Study of , , and BeO Ultrathin Interfacial Barrier Layers in Si Metal-Oxide-Semiconductor Devices
- List of Authors
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- J. Oh
- Todd. W. Hudnall
- C. W. Bielawski
- G. Bersuker
- S. K. Banerjee
- Article ID
- 359580
- Article Type
- Research Article
- No. of Pages
- 7 Pages
- Corresponding Author
- J. H. Yum
- Additional Authors
Invoice Details
- Invoice Issue Date
- 5 May 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $