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List of Authors

  • William McMahon
  • Karl Hess
  • Björn Fischer
  • Leonard F. Register

Article Details

Journal Title
VLSI Design
Volume
13
Article Title
Impact of Scaling on CMOS Chip Failure Rate, and Design Rules for Hot Carrier Reliability
List of Authors
  • William McMahon
  • Karl Hess
  • Björn Fischer
  • Leonard F. Register
Article ID
090787
Article Type
No. of Pages
5 Pages
Corresponding Author
Amr Haggag
Additional Authors

Invoice Details

Invoice Issue Date
29 April 2024
Type of Reprints
Colored, Covered
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