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Article Details
- Journal Title
- VLSI Design
- Volume
- 12
- Article Title
- Random Pattern Testability Enhancement by Circuit Rewiring
- List of Authors
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- Shih-Chieh Chang
- Kwen-Yo Chen
- Ching-Hwa Cheng
- Wen-Ben Jone
- Article ID
- 087048
- Article Type
- No. of Pages
- 13 Pages
- Corresponding Author
- Sunil R. Das
- Additional Authors
Invoice Details
- Invoice Issue Date
- 26 April 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $