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Article Details
- Journal Title
- VLSI Design
- Volume
- 12
- Article Title
- An Efficient Test Pattern Generation Scheme for an On Chip BIST
- List of Authors
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- B. K. S. V. L. Varaprasad
- L. M. Patnaik
- H. S. Jamadagni
- V. K. Agrawal
- Article ID
- 045324
- Article Type
- No. of Pages
- 12 Pages
- Corresponding Author
- Additional Authors
Invoice Details
- Invoice Issue Date
- 24 April 2024
- Type of Reprints
- Colored, Covered
- Invoice Ref. No.
- Terms
- Payable upon Receipt
Charges
- No. of Copies
- Reprints Charges
- 0.00
- Total
- $