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Article Details

Journal Title
VLSI Design
Volume
8
Article Title
Interface Roughness Effects in Ultra-Thin Tunneling Oxides
List of Authors
  • Erik S. Daniel
  • T. C. Mcgill
Article ID
023567
Article Type
No. of Pages
5 Pages
Corresponding Author
D. Z.-Y. Ting
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Invoice Details

Invoice Issue Date
4 December 2022
Type of Reprints
Colored, Covered
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